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wyszukanych pozycji: 10
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A Pound of Flesh
ISBN: 9781645301653 / Angielski / Miękka / 2020 / 218 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
64,97 |
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Loom Crochet Floristry: Crafting Stunning Flower Accessories Book
ISBN: 9798875626906 / Angielski / Miękka / 2024 / 118 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
52,09 |
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Blood Politics
ISBN: 9781105496318 / Angielski / Miękka / 2012 / 176 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
55,61 |
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Kauai Island, the Garden Isle: Travel and Tourism
ISBN: 9781912483051 / Angielski / Miękka / 2017 / 212 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
118,48 |
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Assessing Fault Model and Test Quality
ISBN: 9780792392224 / Angielski / Twarda / 1991 / 132 str. Termin realizacji zamówienia: ok. 22 dni roboczych. For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the...
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault mode...
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cena:
401,58 |
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Happy to Be Me
ISBN: 9781973673095 / Angielski / Miękka / 2019 / 28 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
77,09 |
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Assessing Fault Model and Test Quality
ISBN: 9781461366027 / Angielski / Miękka / 2012 / 132 str. Termin realizacji zamówienia: ok. 22 dni roboczych. For many years, the dominant fault model in automatic test pattern gen- eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the...
For many years, the dominant fault model in automatic test pattern gen- eration (ATPG) for digital integrated circuits has been the stuck-at fault mod...
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cena:
401,58 |
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Psalms of Iraq
ISBN: 9780976854050 / Angielski / Miękka / 2008 / 72 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
42,00 |
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A History of the Kennedy Space Center
ISBN: 9780813068343 / Angielski / Miękka / 2020 / 496 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This inspirational history of Kennedy SpaceCenter explores man's attempts to conquer the final frontier from Von Braun to the Space Station.
This inspirational history of Kennedy SpaceCenter explores man's attempts to conquer the final frontier from Von Braun to the Space Station.
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cena:
122,30 |
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Making a Difference: Volume I and II : The Proceedings of the Seventh International Conference of the Learning Sciences (ICLS)
ISBN: 9780805861747 / Angielski / Miękka / 2006 / 1168 str. Termin realizacji zamówienia: ok. 22 dni roboczych. First published in 2006. Routledge is an imprint of Taylor & Francis, an informa company.
First published in 2006. Routledge is an imprint of Taylor & Francis, an informa company.
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cena:
1175,45 |
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