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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.

Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment one of the most...

This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are...