wyszukanych pozycji: 3
UDSM CMOS Circuits
ISBN: 9783659523038 / Angielski / Miękka / 2014 / 96 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. A simple and accurate delay model is proposed for Ultra Deep Sub-micron CMOS circuits (CMOS Inverter, NAND2, NOR2 etc) based on nth power law when the channel length is less than the 90nm. All the parameters are taken from BSIM.4.6.1 manual. This work derives analytical expression for the delay model of a CMOS inverter including all sorts of secondary effects i.e. Body Bias effect, Channel Length Modulation Effect (CLM), Velocity Saturation effect, Drain Induced Barrier Lowering (DIBL), Gate Induced Drain Leakage (GIDL), Substrate Current Induced Body Effect (SCBE), Drain-Induced Threshold...
A simple and accurate delay model is proposed for Ultra Deep Sub-micron CMOS circuits (CMOS Inverter, NAND2, NOR2 etc) based on nth power law when the...
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cena:
272,62 zł |
Proceedings of the 3rd International Conference on Communication, Devices and Computing: ICCDC 2021
ISBN: 9789811691560 / Angielski / Miękka / 2023 / 767 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This book provides insights into the 3rd International Conference on Communication, Devices and Computing (ICCDC 2021), which was held in Haldia, India, on August 16–18, 2021. It covers new ideas, applications, and the experiences of research engineers, scientists, industrialists, scholars, and students from around the globe. The proceedings highlight cutting-edge research on communication, electronic devices, and computing and address diverse areas such as 5G communication, spread spectrum systems, wireless sensor networks, and signal processing for secure communication, error control...
This book provides insights into the 3rd International Conference on Communication, Devices and Computing (ICCDC 2021), which was held in Haldia, Indi...
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cena:
966,09 zł |
An Improved Mosfet I-V Model and Its Application in Nano-CMOS Circuits
ISBN: 9783659447525 / Angielski / Miękka / 2013 / 72 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. A compact MOSFET I-V model for estimating the drain current of sub-90nm MOSFET in the linear and saturation regions is proposed. It is a modification of nth-power law model introduced by Sakurai and Newton. The proposed model provides more accurate relationship between the channel length modulation and gate voltage in the saturation region. New parameters are introduced for better characterization of drain current of MOSFET at lower VGS and VDS. The proposed model is compared with Modified Sakurai-Newton (MSN) Current model and Extended-Sakurai-Newton (ESN) Compact MOSFET model, and it is...
A compact MOSFET I-V model for estimating the drain current of sub-90nm MOSFET in the linear and saturation regions is proposed. It is a modification ...
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cena:
198,14 zł |