wyszukanych pozycji: 4
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
ISBN: 9780471181729 / Angielski / Twarda / 1999 / 248 str. Termin realizacji zamówienia: ok. 22 dni roboczych. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness...
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cena:
846,57 zł |
Handbook of Ellipsometry
ISBN: 9780815514992 / Angielski / Twarda / 2005 / 886 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale. With the...
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase a...
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cena:
2136,33 zł |
A User's Guide to Ellipsometry
ISBN: 9780486450285 / Angielski / Miękka / 2006 / 260 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.
"A User's Guide to Ellipsometry" will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and... This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films a...
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cena:
74,75 zł |
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
ISBN: 9781606507278 / Angielski / Miękka / 2015 / 178 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the... Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films rangin... |
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cena:
352,58 zł |