wyszukanych pozycji: 3
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Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
ISBN: 9783540426950 / Angielski / Twarda / 2003 / 492 str. Termin realizacji zamówienia: ok. 20 dni roboczych. The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- peared about 10 years ago. Since then a very active development has oc- curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor- rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials...
The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- pe...
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cena:
769,29 zł |
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Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
ISBN: 9783642627224 / Angielski / Miękka / 2012 / 492 str. Termin realizacji zamówienia: ok. 20 dni roboczych. The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- peared about 10 years ago. Since then a very active development has oc- curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor- rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials...
The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- pe...
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cena:
769,29 zł |
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Physical Chemistry Of, in and on Silicon
ISBN: 9783642735066 / Angielski / Miękka / 2011 / 122 str. Termin realizacji zamówienia: ok. 20 dni roboczych. The aim of this book is twofold: it is intended for use as a textbook for a ourse on electronic materials (indeed, it stems from a series of lectures on this topic delivered at Milan Polytechnic and at the universities of Modena and Parma), and as an up-to-date review for scientists working in the field:: >f silicon processing. Although a number of works on silicon are already available, the vast amount of existing and new data on silicon properties are nowhere adequately summarized in a single comprehensive report. The present volume is intended to fill this gap. Most of the examples dealt...
The aim of this book is twofold: it is intended for use as a textbook for a ourse on electronic materials (indeed, it stems from a series of lectures ...
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cena:
192,30 zł |