wyszukanych pozycji: 4
Debug Automation from Pre-Silicon to Post-Silicon
ISBN: 9783319356105 / Angielski / Miękka / 2016 / 171 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults) finds the...
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The ...
|
|
cena:
202,66 |
Debug Automation from Pre-Silicon to Post-Silicon
ISBN: 9783319093086 / Angielski / Twarda / 2014 / 171 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults) finds the...
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The ...
|
|
cena:
202,66 |
![]() |
Robustness and Usability in Modern Design Flows
ISBN: 9789048176625 / Angielski / Miękka / 2010 / 166 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The size of technically producible integrated circuits increases continuously. But the ability to design and verify these circuits does not keep up with this development. Therefore, today s design ?ow has to be improved to achieve a higher productivity. In this book the current design methodology and ver- cation methodology are analyzed, a number of de?ciencies are identi?ed, and solutions are suggested. Improvements in the methodology as well as in the underlying algorithms are proposed. An in-depth presentation of preliminary concepts makes the book self-contained. Based on this foundation...
The size of technically producible integrated circuits increases continuously. But the ability to design and verify these circuits does not keep up wi...
|
cena:
405,36 |
![]() |
Advanced BDD Optimization
ISBN: 9781441937964 / Angielski / Miękka / 2010 / 234 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. VLSI CAD has greatly benefited from the use of reduced ordered Binary Decision Diagrams (BDDs) and the clausal representation as a problem of "Boolean Satisfiability" (SAT), e.g. in logic synthesis, verification or design-for-testability. In recent practical applications, BDDs are optimized with respect to new objective functions for design space exploration. The latest trends show a growing number of proposals to fuse the concepts of BDD and SAT. Advanced BDD Optimization gives a modern presentation of the established as well as of recent concepts. Latest results in BDD optimization... VLSI CAD has greatly benefited from the use of reduced ordered Binary Decision Diagrams (BDDs) and the clausal representation as a problem of "Bool... |
cena:
608,07 |