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With the continuous technology advance, the feature size of nowadays integrated circuits (IC) has entered the nanometer era, which introduces many significant challenges for IC designs. This book provides an overview of these issues and further develops some potential solutions to address these important topics. The contents of this book are based upon several previous publications, which were published in top-ranked international conferences, mainly from IEEE/ACM Design Automation Conference. This book clearly describes the sources of inevitable uncertainties observed from...