wyszukanych pozycji: 2
Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction (2nd Edition)
ISBN: 9781783265282 / Angielski / Twarda / 2015 / 432 str. Termin realizacji zamówienia: ok. 22 dni roboczych. Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes...
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscop...
|
|
cena:
467,48 zł |
Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction
ISBN: 9781848165366 / Angielski / Twarda / 2010 / 348 str. Termin realizacji zamówienia: ok. 22 dni roboczych. This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering...
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it a...
|
|
cena:
395,56 zł |