wyszukanych pozycji: 7
Advances in Electronic Testing: Challenges and Methodologies
ISBN: 9781489987730 / Angielski / Miękka / 2014 / 412 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today s state of the art and industrial practices and trends, reveals... Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devo... |
|
cena:
578,30 zł |
Advances in Electronic Testing: Challenges and Methodologies
ISBN: 9780387294087 / Angielski / Twarda / 2006 / 412 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics. This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. T... |
|
cena:
578,30 zł |
Cross-Layer Reliability of Computing Systems
ISBN: 9781785617973 / Angielski / Twarda / 2020 / 328 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
|
cena:
697,20 zł |
Embedded Processor-Based Self-Test
ISBN: 9781402027857 / Angielski / Twarda / 2004 / 217 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based... Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularl... |
|
cena:
578,30 zł |
Embedded Processor-Based Self-Test
ISBN: 9781441952523 / Angielski / Miękka / 2011 / 217 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based... Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularl... |
|
cena:
578,30 zł |
Dependable Multicore Architectures at Nanoscale
ISBN: 9783319544212 / Angielski / Twarda / 2017 / 281 str. Termin realizacji zamówienia: ok. 20 dni roboczych. |
|
cena:
385,52 zł |
Dependable Multicore Architectures at Nanoscale
ISBN: 9783319853918 / Angielski / Miękka / 2018 / 281 str. Termin realizacji zamówienia: ok. 20 dni roboczych. |
|
cena:
385,52 zł |