wyszukanych pozycji: 2
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Defects in Microelectronic Materials and Devices
ISBN: 9780367386399 / Angielski / Miękka / 2019 / 770 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
318,45 zł |
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Defects in Microelectronic Materials and Devices
ISBN: 9781420043761 / Angielski / Twarda / 2008 / 770 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. Uncover the Defects that Compromise Performance and Reliability A comprehensive survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies, this book also discusses flaws in linear bipolar technologies, silicon carbide-based devices, and... Uncover the Defects that Compromise Performance and Reliability |
cena:
950,37 zł |