Wyniki wyszukiwania:
wyszukanych pozycji: 10
 |
Graphene and VLSI Interconnects
ISBN: 9789814877824 / Angielski / Twarda / 2021 / 116 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
565,82 zł |
 |
Reliability and Failure Analysis of High-Power Led Packaging
ISBN: 9780128224083 / Angielski / Miękka / 2022 Termin realizacji zamówienia: ok. 30 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
756,05 zł |
 |
Electromigration in ULSI Interconnections
ISBN: 9789814273329 / Angielski / Twarda / 2010 / 312 str. Termin realizacji zamówienia: ok. 30 dni roboczych (Bez gwarancji dostawy przed świętami) Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on electromigration, and examines the various interconnected systems and their evolution employed in integrated circuit technology. The subsequent chapters provide a detailed description of the physics of electromigration in both Al- and Cu-based Interconnections, in the form of theoretical, experimental...
Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both...
|
cena:
487,78 zł |
 |
Simulated Annealing
ISBN: 9789537619077 / Angielski / Twarda / 2008 / 430 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
722,30 zł |
 |
Electromigration Modeling at Circuit Layout Level
ISBN: 9789814451208 / Angielski / Miękka / 2013 / 103 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief addresses the readers to the necessity of 3D real circuit modelling in order to evaluate the EM of interconnect system in ICs, and how they can create such models for their own applications. A 3-dimensional...
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the ...
|
cena:
201,72 zł |
 |
Theory and Practice of Quality and Reliability Engineering in Asia Industry
ISBN: 9789811032882 / Angielski / Twarda / 2017 / 300 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book discusses the application of quality and reliability engineering in Asian industries, and offers information for multinational companies (MNC) looking to transfer some of their operation and manufacturing capabilities to Asia and at the same time maintain high levels of reliability and quality.
This book discusses the application of quality and reliability engineering in Asian industries, and offers information for multinational companies (MN...
|
cena:
806,99 zł |
 |
Theory and Practice of Quality and Reliability Engineering in Asia Industry
ISBN: 9789811098345 / Angielski / Miękka / 2018 / 300 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
806,99 zł |
 |
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ISBN: 9781447126416 / Angielski / Miękka / 2013 / 152 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics. To help readers cope with the increasing sophistication of FEMs' applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will:... Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application o... |
cena:
403,47 zł |
 |
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ISBN: 9780857293091 / Angielski / Twarda / 2011 / 150 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics. To help readers cope with the increasing sophistication of FEMs' applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will:... Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application o... |
cena:
403,47 zł |
 |
Reliability Analysis of Electrotechnical Devices
ISBN: 9783036546537 / Angielski / Twarda / 2022 / 174 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
266,86 zł |
Czytaj nas na:
KrainaKsiazek.PL - Księgarnia Internetowa
