Exponential Fatigue Life Model for Single-Edge-Notched Beams

ISBN-13: 9786209272837 / Angielski / Miękka / 2025 / 80 str.

Avaya Kumar Baliarsingh; Debabrata Rath

Opis

This book presents a comprehensive and practical exploration of fatigue crack propagation in single-edge-notched (SEN) beams through the application of an exponential modelling framework. Designed for researchers, engineers, and advanced students, it bridges fundamental fracture mechanics with modern predictive methodologies for evaluating fatigue life. The text offers clear theoretical insights, validated analytical models, and illustrative case studies that demonstrate the accuracy and usefulness of exponential crack growth laws in structural assessment. By combining scientific rigor with accessible explanations, this book equips readers with the knowledge and tools needed to predict fatigue behaviour more reliably, enhance material integrity, and support safer, more efficient engineering designs.