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The structural characterization techniques addressed include: scanning electron microscopy (SEM), X-ray diffraction (XRD), transmission electron microscopy (TEM), optical microscopy (OM), differential thermal analysis (DAT), differential scanning calorimetry (DSC), and thermogravimetry analysis (TGA).

This book is a compilation of papers presented at Symposium 4, Materials Characterization, held at the XVIII International Materials Research Congress 2009 in Cancun, Mexico. The symposium was co-organized by the Sociedad Mexicana de Materiales (MRS-Mexico) and the Materials Research Society (MRS). These proceedings offer materials scientists from around the world a common platform to exchange their findings and discuss developments, and begin collaborations at the national and international levels. Topics include: materials characterization by X-ray diffraction, infrared spectroscopy,...