X-Ray Diffraction for Materials Research: From Fundamentals to Applications

ISBN-13: 9781771882989 / Angielski / Twarda / 2016 / 302 str.

Myeongkyu Lee

Opis

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction.

Spis treści

X-Rays and Crystal Geometry. Electromagnetic Waves and X-Rays. Geometry of Crystals. Interference and Diffraction. Theory of X-Ray Diffraction. Directions of X-Ray Diffraction. Intensities of X-Ray Diffraction. Applications of X-Ray Diffraction. Characterization of Thin Films by X-Ray Diffraction. Laue Method And Determination of Single Crystal Orientation. Powder Diffraction. Index.

O autorze

Lee, Myeongkyu||