VLSI Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers

ISBN-13: 9789811074691 / Angielski / Miękka / 2017 / 815 str.

Brajesh Kumar Kaushik; Sudeb Dasgupta; Virendra Singh

Opis

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.

Spis treści

Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.