Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications

ISBN-13: 9780367197360 / Angielski / Twarda / 2020 / 150 str.

Alina Bruma

Opis

This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials.

Spis treści

Chapter 1 Practical Aspects of Quantitative and High-Fidelity STEM Data Recording Chapter 2 Machine Learning for Electron Microscopy Chapter 3 Application of Advanced Aberration-Corrected Transmission Electron Microscopy to Material Science: Methods to Predict New Structures and Their Properties Chapter 4 Large Dataset Electron Diffraction Patterns for the Structural Analysis of Metallic Nanostructures

O autorze

Dr. Alina Bruma received her PhD degree in Nanoscale Physics from The University of Birmingham, UK in 2013. Dr. Bruma completed several postdoctoral stages at the Laboratory of Crystallography and Materials Science (CRISMAT-CNRS) France, University of Texas at San Antonio, USA and The National Institute of Standards and Technology, USA before moving to the American Institute of Physics Publishing in 2019. Her research has been focused on the study of crystalline structure of materials and the determination of their structure-property relationship using transmission electron microscopy and electron diffraction. Dr Bruma is also the Chairman of The Electron Diffraction sub-committee at the International Center for Diffraction Data (ICDD).