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Super-Resolution Microscopy for Material Science
ISBN: 9781032103679 / Twarda / 288 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
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548,82 zł |
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Jesse Ramsden (1735-1800): London's Leading Scientific Instrument Maker
ISBN: 9780754661368 / Twarda / 344 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Jesse Ramsden was one of the most prominent manufacturers of scientific instruments in the latter half of the eighteenth century. This is the biography of Jesse Ramsden. It reconstructs his life and career and presents us with an account of the instrument trade in this period.
Jesse Ramsden was one of the most prominent manufacturers of scientific instruments in the latter half of the eighteenth century. This is the biograph...
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757,90 zł |
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Advances in Imaging and Electron Physics: Calculus of Finite Differences in Quantum Electrodynamics Volume 129
ISBN: 9780120147717 / Angielski / Twarda / 312 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. In particular, the early work of H.F. Harmuth on Maxwell's equations, which was highly controversial at the time, formed a supplement to the series. This volume, unlike previous volumes in the series concentrates solely on the research of professors' Harmuth and Meffert. These studies raise important and fundamental questions concerning some of the basic areas of physics: electromagnetic theory and quantum mechanics. They deserve... Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. ... |
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1679,90 zł |
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Advances in Imaging and Electron Physics: Volume 134
ISBN: 9780120147762 / Angielski / Twarda / 276 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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1679,90 zł |
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Advances in Imaging and Electron Physics: Dogma of the Continuum and the Calculus of Finite Differences in Quantum Physics Volume 137
ISBN: 9780120147793 / Angielski / Twarda / 319 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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1679,90 zł |
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Advances in Imaging and Electron Physics: Volume 144
ISBN: 9780120147861 / Angielski / Twarda / 344 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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888,57 zł |
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Cellular Electron Microscopy: Volume 79
ISBN: 9780123706478 / Angielski / Twarda / 850 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its description of three-dimensional detail. Cellular Electron Microscopy will help biologists from many disciplines understand modern EM and the value it might bring to their own work. The book's five sections deal with all major issues in EM of cells: specimen preparation, imaging in 3-D, imaging and understanding frozen-hydrated samples, labeling macromolecules, and analyzing EM data. Each chapter was written by scientists who are among...
Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its...
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601,09 zł |
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Advances in Imaging and Electron Physics: Volume 145
ISBN: 9780123739070 / Angielski / Twarda / 240 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
1679,90 zł |
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Advances in Imaging and Electron Physics: Volume 147
ISBN: 9780123739094 / Angielski / Twarda / 209 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
1679,90 zł |
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Advances in Imaging and Electron Physics: Volume 148
ISBN: 9780123739100 / Angielski / Twarda / 264 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
888,57 zł |
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Advances in Imaging and Electron Physics: Electron Emission Physics Volume 149
ISBN: 9780123742070 / Angielski / Twarda / 338 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin...
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
993,11 zł |
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Advances in Imaging and Electron Physics: Volume 150
ISBN: 9780123742179 / Angielski / Twarda / 262 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor...
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
1679,90 zł |
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High-Resolution Transmission Electron Microscopy: And Associated Techniques
ISBN: 9780195042757 / Angielski / Twarda / 670 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled...
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, ener...
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442,06 zł |
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Monte Carlo Modeling for Electron Microscopy and Microanalysis
ISBN: 9780195088748 / Angielski / Twarda / 224 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the...
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for...
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835,73 zł |
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 9780306421402 / Angielski / Twarda / 454 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981...
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at L...
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661,48 zł |
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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
ISBN: 9780306435911 / Angielski / Miękka / 407 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new...
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and micr...
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cena:
389,09 zł |
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Electron Microdiffraction
ISBN: 9780306442629 / Angielski / Twarda / 358 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted...
Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful...
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cena:
778,22 zł |
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Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 9780306448904 / Angielski / Twarda / 454 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe...
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lu...
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cena:
583,65 zł |
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Introduction to Electron Holography
ISBN: 9780306449208 / Angielski / Twarda / 354 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This text offers experienced and novice holographers a solid foundation in the theory and practice of holography, the next generation of imaging technology. The guide's how to aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A useful bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences complete the study.
This text offers experienced and novice holographers a solid foundation in the theory and practice of holography, the next generation of imaging techn...
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411,23 zł |
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
ISBN: 9780306472923 / Angielski / Twarda / 689 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled...
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in...
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cena:
428,00 zł |
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