Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials

ISBN-13: 9783540133599 / Angielski / Miękka / 1984 / 186 str.

Y. Waseda

Opis

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Spis treści

A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects.