Energy Dispersive X-ray Analysis in the Electron Microscope

ISBN-13: 9781859961094 / Angielski / Miękka / 2003 / 160 str.

A. J. Garratt-Reed; D. C. Bell;Garratt-Reed

Opis

This work provides an in-depth description of X-ray microanalysis on the electron microscope. It goes into enough detail so that novices will understand the nuances of high-quality EDX analysis. It includes information about hardware design as well as the physics of X-ray generation, absorption and detection, and most post-detection data processing.

Recenzje

'There are numerous good textbooks on the subject, but these are necessarily complicated and contain far more information than is needed to answer the basic questions. The authors have recognised this and have set out to produce something simpler and more easily read...In conclusion, this handbook maintains the Royal Microscopical Society series tradition of bein easy to read and understand.' - The Royal College of Pathologists

Spis treści

Ch 1. HISTORY. Ch 2. PRINCIPLES. What are X-rays?. Ionization cross-section. Fluorescence yield. X-ray absorption. Insulators, conductors and semiconductors. Ch 3. THE ENERGY-DISPERSIVE X-RAY DETECTOR. Introduction.The semiconductor X-ray detector. The X-ray analyser. Details of the spectrum. New detector technologies. Ch 4. SPECTRAL PROCESSING. Introduction. Background stripping. Background modelling. Deconvolution of overlapping peaks. Statistical considerations. The impact of statistics. The effect of the background. Analytical strategy. Ch 5. ENERGY-DISPERSIVE X-RAY MICROANALYSIS IN THE SCANNING ELECTRON MICROSCOPE. Introduction. Fundamentals of X-ray analysis in the SEM. Quantitative microanalysis in the SEM. Semi-quantitative microanalysis in the SEM. EDX analysis in the VP-SEM and ESEM. Inhomogeneous samples. Concluding remarks. Ch 6. X-RAY MICROANALYSIS IN THE TRANSMISSION ELECTRON MICROSCOPE. Introduction. Principles of quantitative analysis in the TEM. Absorption, fluorescence and other sources of error. Spatial resolution. Microscope considerations. Ch 7. X-RAY MAPPING. Introduction. Hardware implementation. Statistical considerations. Other applications. Concluding comments. Ch 8. ENERGY-DISPERSIVE X-RAY ANALYSIS COMPARED WITH OTHER TECHNIQUES. Introduction. Wavelength-dispersive X-ray analysis - electron probe microanalysis (EPMA). Electron energy-loss spectroscopy (EELS). Auger electron spectroscopy (AES). X-ray photoelectron spectroscopy (XPS). X-ray fluorescence (XRF). Atom probe. Overall strengths and weaknesses.

O autorze

DC Bell, AJ Garratt-Reed