Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,

ISBN-13: 9780824785567 / Angielski / Twarda / 1991 / 856 str.

Lawrence E. Murr;Murr; Lawrence E. Murr

Opis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Spis treści

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.

O autorze

Lawrence E. Murr