Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

ISBN-13: 9780521848756 / Angielski / Twarda / 2005 / 232 str.

S. J. B. Reed

Opis

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Recenzje

Review of the hardback: ' …this is a book that has been long overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology

Spis treści

Preface; Acknowledgements; 1. Introduction; 2. Electron-specimen interactions; 3. Instrumentation; 4. Scanning electron microscopy; 5. X-ray spectrometers; 6. Element mapping; 7. X-ray analysis (1); 8. X-ray analysis (2); 9. Sample preparation; Appendix; References; Index.