Diffraction Pattern Indexing

ISBN-13: 9786202991643 / Angielski / Miękka / 140 str.

Tania Campos

Opis

This paper presents the model designed for the analysis of images containing diffraction patterns, as well as the software developed to make measurements of angles and distances between different characteristic points (signals) included in the patterns under study by the researchers of the Center for Research in Advanced Materials (CIMAV). The main reason for developing this system is that researchers must perform the process of analysis and indexing of diffraction patterns manually, a task that becomes tedious and prone to human error. That is why the tool was designed to automate and assist in the indexing of patterns in images, facilitating the process of signal detection and thus achieving a more accurate measurement between the elements of the diffraction pattern analyzed.

O autorze

Campos, Tania Tania Campos obtained a Master's degree in Computer Systems in the area of Artificial Intelligence at the TecNM campus Chihuahua II in 2016. She is co-author of the article Method for Signals Detection in Single Crystal Diffraction Patterns through a Diffraction Pattern Indexing Software published in the Journal of Mechanics Engineering and Automation in 2015.