Defect Prevention: Use of Simple Statistical Tools

ISBN-13: 9780824778873 / Angielski / Twarda / 1989 / 712 str.

V. E. Kane; Victor E. Kane; John Ed. Kane

Opis

This book discusses statistical process control (SPC) concepts, emphasizing the need to establish stability of work processes. It gives the elements required to develop a defect prevention system (DPS), and integrates the application of process control and problem analysis tools.

Recenzje

". . .the most complete one-book collection of simple statistical tools for quality education. . .author Victor E. Kane and editor Edward G. Schilling are due our highest compliments and most appreciative thanks for the prodigious undertaking of writing and publishing their Defect Prevention. "
---Journal of Quality Technology

Spis treści

Basic Concepts of Process Control Defect Prevention Concepts Process Definition and Measurement Problems Control Charts Problems Control Chart Sampling Concepts and Applications Problems Histograms Problems Interpretation of Control Charts Problems Process Capability Problems Simple Problem Analysis Tools Check Sheets Pareto Diagrams Problems Stratification and Graphs Problems Comparision Methods Problems Scatter Plots Problems Cause-and-Effect Diagrams and Problem Solving Defect Prevention System Building a Defect Prevention System Selected Bibliography Appendix I: Gage Evaluation Appendix II: Geometric Dimensioning and Tolerancing Appendix III: Tables

O autorze

Kane\,