Characterization of Nanostructures

ISBN-13: 9781439854150 / Angielski / Twarda / 2012 / 350 str.

Sverre Myhra;John C. Riviere;¬Abar

Opis

The techniques and methods that can be applied to materials characterization on the microscale are numerous and well-established. Divided into two parts, Characterization of Nanostructures provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures, and discusses typical applications to single nanoscale objects, as well as to ensembles of such objects. Section I: Techniques and Methods overviews the physical principles of the main techniques and describes those operational modes that are most relevant to nanoscale characterization. It provides sufficient technical detail so that readers and prospective users can gain an appreciation of the strengths and limitations of particular techniques. The section covers both mainstream and less commonly used techniques. Section II: Applications of Techniques to Structures of Different Dimensionalities and Functionalities deals with the methods for materials characterization of generic types of systems, using carefully chosen illustrations from the literature. Each chapter begins with a brief description of the materials and supplies a context for the methods for characterization. The volume concludes with a series of flow charts and brief descriptions of tactical issues. The authors focus on the needs of the research laboratory but also address those of quality control, industrial troubleshooting, and online analysis. Characterization of Nanostructures describes those techniques and their operational modes that are most relevant to nanoscale characterization. It is especially relevant to systems of different dimensionalities and functionalities. The book builds a bridge between generalists, who play vital roles in the post-disciplinary area of nanotechnology, and specialists, who view themselves as more in the context of the discipline.

Recenzje

"This book provides an understanding of the fundamental concepts of characterisation techniques for nanomaterials such as graphene, fullerenes, carbon nanotubes and quantum dots. The authors have nicely presented the complex theory of the physical techniques in a simple manner that will have immense benefit for the nanoscience community. … This book will be a valuable asset to students and newcomers to the field. Nanoscience researchers will also benefit as it covers the theory, techniques and applications from basic to advanced levels with up to date bibliographic information."
— Tapas Sen, Chemistry World, April 2013

Spis treści

Introduction to Characterization of Nanostructures. Techniques and Methods: Electron-Optical Imaging of Nanostructures ((HR)TEM, STEM, and SEM). Electron-Optical Analytical Techniques. Photon-Optical Spectroscopy—Raman and Fluorescence. Scanning Probe Techniques and Methods. Techniques and Methods for Nanoscale Analysis of Single C₆₀ and Other Cage Structures. Applications: Quantum Dots and Related Structures. Carbon Nanotubes and Other Tube Structures. Nanowires. Graphene and Other Monolayer Structures. Nanostructures—Strategic and Tactical Issues.

O autorze

Sverre Myhra and John Riviere are affiliated with Oxford University, UK.