Advances in Imaging and Electron Physics: Volume 179

ISBN-13: 9780124077003 / Angielski / Twarda / 2013 / 410 str.

Peter Hawkes

Opis

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading authorities
• Informs and updates on all the latest developments in the field

Spis treści

1. Invariant Quantum Wave Equations and Double Space-TimeClaude Daviau
2. In-Situ and Correlative Electron MicroscopyNiels de Jonge
3. Electron Tweezers as a Tool for High Precision Manipulation of NanoobjectsVladimir P. Oleshko and James M. Howe
4. Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy ImagesPilar Sobrevilla , Eduard Montseny, and Aina Barcelo
5. Measure-by-Wire: An Automatic Control Framework for High-Throughput Transmission Electron MicroscopyArturo Tejada, Wouter Van den Broek, and Arnold J. den Dekker

O autorze

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.