Applied Crystallography - Proceedings of the XVII International Conference

ISBN-13: 9789810232832 / Angielski / Twarda / 1998 / 512 str.

D. Stroz; H. Morawiec; Henryk Morerawiec

Opis

This proceedings volume contains research data on structural investigation of materials of high industrial value. Topics discussed include: phase characterization by diffraction methods; application of direct methods for solving crystal structure from powder diffraction; electron crystallography; Rietveld method applications; defects and substructure analysis in materials; new x-ray methods; small-angle scattering studies of crystyalline and amorphous solids; phase transformation studies, including crystallography of the reversible martenistic transformation; structure of non-crystalline materials; and structure and properties of new materials.