wyszukanych pozycji: 22
![]() |
Microanalysis of Solids
ISBN: 9781489914941 / Angielski / Miękka / 2013 / 460 str. Termin realizacji zamówienia: ok. 20 dni roboczych. The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi- mately 1 m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi- croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis...
The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, st...
|
cena:
780,00 zł |
![]() |
Extended Defects in Semiconductors: Electronic Properties, Device Effects and Structures
ISBN: 9780521819343 / Angielski / Twarda / 2007 / 644 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. Covering topics that are especially important in electronic device development, this book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.
Covering topics that are especially important in electronic device development, this book surveys the properties, effects, roles and characterization ...
|
cena:
854,35 zł |