Kategoria BISAC: Technology & Engineering >> Materials Science - Electronic Materials

In this second volume of the book series devoted to photorefractive effects we focus on the most recent developments in the field of photorefractive materials and we highlight the parameters which govern the photoinduced nonlinearity. The availability of materials having the required properties is of major importance for further development of this field, and there are many parameters which have to be considered in the figure of merit of a photorefractive material. As an example, it concerns in priority, the recording slope of the dynamic hologram and the saturation value of the index...

Nanometer scale physics is progressing rapidly: the top-down approach of semiconductor technology will soon encounter the scale of the bottom-up approaches of supramolecular chemistry and spatially localized excitations in ionic crystals. Advances in this area have already led to applications in optoelectronics. More may be expected.

This book deals with the role of structure confinement in the spectroscopic characteristics of physical systems. It examines the fabrication, measurement and understanding of the relevant structures. It reports progress in the theory and in experimental...

Nanometer scale physics is progressing rapidly: the top-down approach of semiconductor technology will soon encounter the scale of the bottom-up approaches of supramolecular chemistry and spatially localized excitations in ionic crystals. Advances in this area have already led to applications in optoelectronics. More may be expected.

This book deals with the role of structure confinement in the spectroscopic characteristics of physical systems. It examines the fabrication, measurement and understanding of the relevant structures. It reports progress in the theory and in experimental...

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is...