Kategoria BISAC: Technology & Engineering >> Electronics - Microelectronics

Interferometric observations need snapshots of very high time resolution of the order of (i) frame integration of about 100 Hz or (ii) photon-recording rates of several megahertz (MHz). Detectors play a key role in astronomical observations, and since the explanation of the photoelectric effect by Albert Einstein, the technology has evolved rather fast. The present-day technology has made it possible to develop large-format complementary metal oxide semiconductor (CMOS) and charge-coupled device (CCD) array mosaics, orthogonal transfer CCDs, electron-multiplication CCDs, electron-avalanche...

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will...

Introductory MEMS: Fabrication and Applications is a practical introduction to MEMS for advanced undergraduate and graduate students. Part I introduces the student to the most commonly used MEMS fabrication techniques as well as the MEMS devices produced using these techniques. Part II focuses on MEMS transducers: principles of operation, modeling from first principles, and a detailed look at commercialized MEMS devices, in addition to microfluidics. Multiple field-tested laboratory exercises are included, designed to facilitate student learning about the fundamentals of...

This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields.

The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their...

• Contributions from leading authorities
• Informs and updates on all...

As electronics have shrunk and power requirements have gotten less demanding, it's no surprise that we're starting to wear our electronic creations. Today's microcontrollers are tiny micro-sized computers that can be embedded into many projects--especially wearables. And they are perfectly happy running off a coin cell or rechargeable lithium polymer battery. This issue explores the latest trends in microcontrollers, with a special focus on wearable and lightweight boards. With 34 projects inside, you can build everything from a smart watch to your own electronic garments. A special...

Discovery of one-dimensional material carbon nanotubes in 1991 by the Japanese physicist Dr. Sumio Iijima has resulted in voluminous research in the field of carbon nanotubes for numerous applications, including possible replacement of silicon used in the fabrication of CMOS chips. One interesting feature of carbon nanotubes is that these can be metallic or semiconducting with a bandgap depending on their diameter. In search of non-classical devices and related technologies, both carbon nanotube-based field-effect transistors and metallic carbon nanotube interconnects are being explored...

Advanced Techniques in Computing Sciences and Software Engineering includes a set of rigorously reviewed world-class manuscripts addressing and detailing state-of-the-art research projects in the areas of Computer Science, Software Engineering, Computer Engineering, and Systems Engineering and Sciences.

Advanced Techniques in Computing Sciences and Software Engineering includes selected papers form the conference proceedings of the International Conference on Systems, Computing Sciences and Software Engineering (SCSS 2008) which was part of the International Joint Conferences on...

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contains contributions from leading authorities on the subject...

This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characterization techniques for recovery artefact free BTI measurements. It also covers different direct measurements techniques to...

Developments in Surface Contamination and Cleaning, Vol. 1: Fundamentals and Applied Aspects, Second Edition, provides an excellent source of information on alternative cleaning techniques and methods for characterization of surface contamination and validation.

Each volume in this series contains a particular topical focus, covering the key techniques and recent developments in the area. This volume forms the heart of the series, covering the fundamentals and application aspects, characterization of surface contaminants, and methods for removal of surface contamination....

• Contains comments from leading contributors in the field semiconductor nanowires
• Provides reviews of the most important recent literature
• Presents a broad view, including an examination of semiconductor nanowires

• Comprises up to date advancements in the technological development of nanowire devices and systems, and is comprehensive enough to be used as a reference book on nanowires as well as a graduate student text...