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Kategorie szczegółowe BISAC

Kategoria BISAC: Science >> Electron Microscopes & Microscopy

ilość książek w kategorii: 267

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 Key Concepts of Scanning Electron Microscopy Lisa Page 9781632383068 NY Research Press
Key Concepts of Scanning Electron Microscopy

ISBN: 9781632383068 / Angielski / Twarda / 256 str.

ISBN: 9781632383068/Angielski/Twarda/256 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Lisa Page
This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine...
This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevit...
cena: 422,73 zł

 Scanning Electron Microscopy Lisa Page 9781632384065 NY Research Press
Scanning Electron Microscopy

ISBN: 9781632384065 / Angielski / Twarda / 292 str.

ISBN: 9781632384065/Angielski/Twarda/292 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Lisa Page
Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron...
Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well inst...
cena: 480,38 zł

 Sample Preparation Handbook for Transmission Electron Microscopy: Methodology Ayache, Jeanne 9781489986979 Springer
Sample Preparation Handbook for Transmission Electron Microscopy: Methodology

ISBN: 9781489986979 / Angielski / Miękka / 250 str.

ISBN: 9781489986979/Angielski/Miękka/250 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be...
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen prepara...
cena: 403,47 zł

 Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers: Volume 192 Hawkes, Peter W. 9780128022528 Elsevier Science
Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers: Volume 192

ISBN: 9780128022528 / Angielski / Twarda / 224 str.

ISBN: 9780128022528/Angielski/Twarda/224 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the...

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advan...

cena: 827,53 zł

 Particles and Waves in Electron Optics and Microscopy: Volume 194 Hawkes, Peter W. 9780128048146 Academic Press
Particles and Waves in Electron Optics and Microscopy: Volume 194

ISBN: 9780128048146 / Angielski / Twarda / 358 str.

ISBN: 9780128048146/Angielski/Twarda/358 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject...

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advance...

cena: 827,53 zł

 Single-Molecule Microscopy and Spectroscopy: Faraday Discussion 184 Royal Society of Chemistry   9781782624615 Royal Society of Chemistry
Single-Molecule Microscopy and Spectroscopy: Faraday Discussion 184

ISBN: 9781782624615 / Angielski / Twarda / 494 str.

ISBN: 9781782624615/Angielski/Twarda/494 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Royal Society Of Chemistry
Since their inception, optical detection and spectroscopy of single molecules have steadily expanded to an amazing variety of disciplines in the natural sciences. Domains such as optical microscopy, quantum optics, nanophotonics and soft matter/ material science have all benefited from the new, "average-free" insights provided by the optical isolation of single molecules, quantum dots, metal nanoparticles, and other nanometre-sized objects. The techniques themselves have also made spectacular progress with developments in super-resolution microscopy, time-resolved measurements,...
Since their inception, optical detection and spectroscopy of single molecules have steadily expanded to an amazing variety of disciplines in the natur...
cena: 827,53 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780128048122 Academic Press
Advances in Imaging and Electron Physics

ISBN: 9780128048122 / Angielski / Twarda / 358 str.

ISBN: 9780128048122/Angielski/Twarda/358 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject...

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advance...

cena: 827,53 zł

 Basic Confocal Microscopy Robert L. Price W. Gray Jay Jerome 9781493939350 Springer
Basic Confocal Microscopy

ISBN: 9781493939350 / Angielski / Miękka / 302 str.

ISBN: 9781493939350/Angielski/Miękka/302 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Robert L. Price; W. Gray Jay Jerome
A result of the demand for training in what is a relatively young field, this book covers all the basics needed to design, implement, and interpret the results of biological experiments based on confocal microscopy, as well as resources for continued learning.
A result of the demand for training in what is a relatively young field, this book covers all the basics needed to design, implement, and interpret th...
cena: 641,03 zł

 Electron Microscopy and Analysis Peter J. Goodhew 9781138441538 Taylor and Francis
Electron Microscopy and Analysis

ISBN: 9781138441538 / Angielski / Twarda

ISBN: 9781138441538/Angielski/Twarda

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter J. Goodhew
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for...
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially...
cena: 924,88 zł

 Atomic Force Microscopy in Biomedical Research: Methods and Protocols Braga, Pier Carlo 9781493962792 Humana Press
Atomic Force Microscopy in Biomedical Research: Methods and Protocols

ISBN: 9781493962792 / Angielski / Miękka / 508 str.

ISBN: 9781493962792/Angielski/Miękka/508 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Pier Carlo Braga; Davide Ricci
cena: 665,76 zł

 Earth Magnetism: Problems with Electric Charges, on Earth, in Atmosphere, in Van Allen Belt and on the Moon Phd Nguyen Din Phd Vu Bang Nguyen Va 9781799165644 Independently Published
Earth Magnetism: Problems with Electric Charges, on Earth, in Atmosphere, in Van Allen Belt and on the Moon

ISBN: 9781799165644 / Angielski / Miękka / 220 str.

ISBN: 9781799165644/Angielski/Miękka/220 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Phd Nguyen Dinh Noan; Phd Vu Bang; Nguyen Van Cuong
cena: 56,45 zł

 
Electron Microscopy - Proceedings of the International Symposium

ISBN: 9789810205317 / Angielski / Twarda / 492 str.

ISBN: 9789810205317/Angielski/Twarda/492 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Ke-Hsin Kuo; Junen Yao
cena: 754,51 zł

 Electron Microscopy in Materials Science - Proceedings of the International School P. G. Merli M. Vittori Antisari 9789810209247 World Scientific Publishing Company
Electron Microscopy in Materials Science - Proceedings of the International School

ISBN: 9789810209247 / Angielski / Twarda / 696 str.

ISBN: 9789810209247/Angielski/Twarda/696 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
P. G. Merli; M. Vittori Antisari
cena: 1070,92 zł

 Electron Microscopy I - Proceedings of the 5th Asia-Pacific Electron Microscopy Conference Z. H. Zhai Ke-Hsin Kuo 9789810209988 World Scientific Publishing Company
Electron Microscopy I - Proceedings of the 5th Asia-Pacific Electron Microscopy Conference

ISBN: 9789810209988 / Angielski / Twarda / 660 str.

ISBN: 9789810209988/Angielski/Twarda/660 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Z. H. Zhai; Ke-Hsin Kuo
cena: 1022,24 zł

 Diseases of Field Crops Diagnosis and Management: Volume 2: Pulses, Oil Seeds, Narcotics, and Sugar Crops J. N. Srivastava A. K. Sing 9781771888400 Apple Academic Press
Diseases of Field Crops Diagnosis and Management: Volume 2: Pulses, Oil Seeds, Narcotics, and Sugar Crops

ISBN: 9781771888400 / Angielski / Twarda / 400 str.

ISBN: 9781771888400/Angielski/Twarda/400 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
J. N. Srivastava; A. K. Singh Phd
cena: 637,69 zł

 Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003 McVitie, S. 9780367394530 Taylor and Francis
Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003

ISBN: 9780367394530 / Angielski / Miękka / 279 str.

ISBN: 9780367394530/Angielski/Miękka/279 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the pr...
cena: 311,49 zł

 
Science And Space Activity Book For Kids Ages 4-8: Learn About Atoms, Magnets, Planets, Organisms, Insects, Dinosaurs, Satellites, Molecules, Photosyn

ISBN: 9781705636596 / Angielski / Miękka / 80 str.

ISBN: 9781705636596/Angielski/Miękka/80 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
My Activity Engine
cena: 40,31 zł

 Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope Anjam Khursheed 9789811227028 World Scientific Publishing Company
Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope

ISBN: 9789811227028 / Angielski / Twarda / 344 str.

ISBN: 9789811227028/Angielski/Twarda/344 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Anjam Khursheed
cena: 535,46 zł

 Practical Electron Microscopy of Lattice Defects Hiroyasu Saka 9789811234699 World Scientific Publishing Company
Practical Electron Microscopy of Lattice Defects

ISBN: 9789811234699 / Angielski / Twarda / 308 str.

ISBN: 9789811234699/Angielski/Twarda/308 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Hiroyasu Saka
cena: 486,78 zł

 Scanning Electrochemical Microscopy Allen J. Bard Michael V. Mirkin 9780367430566 CRC Press
Scanning Electrochemical Microscopy

ISBN: 9780367430566 / Angielski / Twarda / 610 str.

ISBN: 9780367430566/Angielski/Twarda/610 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Allen J. Bard; Michael V. Mirkin
cena: 973,56 zł

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