Kategoria BISAC: Computers >> Computer Architecture

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn...

This title includes a number of Open Access chapters.

Covering a broad range of new topics in computer technology and programming, this volume discusses encryption techniques, SQL generation, Web 2.0 technologies, and visual sensor networks. It also examines reconfigurable computing, video streaming, animation techniques, and more. Readers will learn about an educational tool and game to help students learn computer programming. The book also explores a new medical technology paradigm centered on wireless technology and cloud computing designed to overcome the problems of increasing...

Achieve Extreme Application Performance for a Private Cloud with Oracle Exalogic Elastic Cloud

Transition to a private cloud computing infrastructure and achieve unmatched levels of performance with help from this Oracle Press guide. Oracle Exalogic Elastic Cloud Handbook shows you how to plan, implement, and maintain a private cloud. Find out how to set up components, deploy Java applications, maximize redundancy and throughput, and migrate legacy workloads. Examples, screenshots, and diagrams are included throughout this comprehensive resource.

• Configure Oracle...

Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the design and layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, mask planning, simulation and manufacturing, and through statistical design and statistical timing closure of the design. It alerts the designer to the...