Tetraphenylporphyrin, TPP, thin films have been prepared by thermal evaporation technique. Structural formation of TPP thin films has been investigated by single crystal and powder diffractometers and Fourier transform infrared spectroscopy. The optical properties of TPP films were investigated using spectrophotometric measurements of the transmittance and reflectance at normal incidence of light. The optical constants and dispersion parameters TPP have been measured the effect of the annealing temperature and X- ray irradiation dose on the optical, electrical properties of TPP thin films as...