Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies....
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly pro...
This book serves as a single-source reference to the latest advances in Approximate Computing (AxC), a promising technique for increasing performance or reducing the cost and power consumption of a computing system. The authors discuss the different AxC design and validation techniques, and their integration. They also describe real AxC applications, spanning from mobile to high performance computing and also safety-critical applications.
This book serves as a single-source reference to the latest advances in Approximate Computing (AxC), a promising technique for increasing performance ...
