Designed for students, engineers and practitioners, this book articulates electrostatic theory and capacitive instrumentation in order to move from model to device. After the fundamentals (vector calculus, Laplace/Poisson equations, boundary conditions, uniqueness theorem), it covers dielectric media, capacitance, energy and forces (Maxwell stress, edge effects) and their design implications. A substantial block details FDM/FEM/BEM numerical methods: choice of symmetries, meshing, convergence criteria, experimental validation. On the measurement side, the book covers LCR meters, Schering...