This book deals with efficient estimation and optimization methods to improve the design of electrotechnical devices under uncertainty. Uncertainties caused by manufacturing imperfections, natural material variations, or unpredictable environmental influences, may lead, in turn, to deviations in operation. This book describes two novel methods for yield (or failure probability) estimation. Both are hybrid methods that combine the accuracy of Monte Carlo with the efficiency of surrogate models. The SC-Hybrid approach uses stochastic collocation and adjoint error indicators. The...

This book deals with efficient estimation and optimization methods to improve the design of electrotechnical devices under uncertainty. Uncertainties caused by manufacturing imperfections, natural material variations, or unpredictable environmental influences, may lead, in turn, to deviations in operation. This book describes two novel methods for yield (or failure probability) estimation. Both are hybrid methods that combine the accuracy of Monte Carlo with the efficiency of surrogate models. The SC-Hybrid approach uses stochastic collocation and adjoint error indicators. The...