Over the past few decades, reliability has grown to become an important design attribute of critical electronic systems. Reliability is embedded into systems during design phase itself and improved by means of failure analysis & testing. However, it is important to verify the reliability of a critical system before it is deployed. The three well-known methods for reliability prediction are empirical method, physics of failure and life testing. Accelerated life testing, on the other hand is an extension of life testing method where the units under test are subjected to elevated stress levels...