The GISAXS technique is a technique of Surface Science monitoring and characterizing in situ and in real time, the evolution of nanostructures in the course of their growth process; starting from the early stages to the completeness. Some other techniques are already widely spread and common such as: spectroscopies, near field microscopies and structural characterization tools in the real space or observation in reciprocal space. Others are highly specialized laboratory tools available only around synchrotron radiation facilities in a very limited number of locations worldwide. The progress...