Today, digital logic circuits are essential embedded parts of devices that are critically important due to impact on public safety. Such devices include transportation, human implants and critical systems' management where Fault-Tolerant (FT) concept is the bottom line. To implement the concept of FT it is essential to test the system accurately to measure all the critical parameters of a dependable system. Challenges of testing has become more difficult due to ubiquitous and complexity of digital systems. Exhaustive testing is impossible and ATEs are not commonly affordable that led to the...