This text intends to give insight into assembly of flip chip (FC) package and its reliability at high-temperature applications. Its focus is to predict the reliability of lead-free solder joints in FC model FC48D6.3C457 which is mounted on a printed circuit board and subjected to Accelerated Temperature Cycles (ATCs) between -38 C and 157 C and employing IEC standard 60749-25 in parts. It presents the effect of control factors (component standoff height, inter-metallic compound (IMC) thickness, number of thermal cycle and solder volume) on mean-time to failure of the joints. Numerical...