This book includes two testing methodologies based on Built In Sensors (BIS) and an optimization-based technique. The first part proposes two novel built-in sensors (BISs) for digital CMOS and analog circuits testing. The BISs have no voltage degradation, able to detect, identify and localize open and short circuit faults,have simple realizations with very small area and detection time. BIS is used to test a 4x4 multiplier cell where all injected faults are detected and localized. The other BIS is dedicated to test analog circuits. It is applied to test two well-known analog building blocks;...