The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be performed on layers with thicknesses on the atomic scale. Furthermore,...
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the ...
Owing to new physical, technological, and device concepts of low-dimensionalelectronic systems, the physics and fabrication of quasi-zero, one- and two-dimensional systems are rapidly growing fields. The contributions presented in this volume cover results of nanostructure fabrication including recently developed techniques, for example, tunneling probe techniques and molecular beam epitaxy, quantum transport including the integer and fractional quantum Hall effect, optical and transport studies of the two-dimensional Wigner solid, phonon studies of low-dimensional systems, and Si/SiGe...
Owing to new physical, technological, and device concepts of low-dimensionalelectronic systems, the physics and fabrication of quasi-zero, one- and tw...
