Radiation-induced Soft Errors: A Chip-level Modeling Perspective summarizes and discusses selected publications that enable a truly chip-level radiation-induced soft error rate estimation methodology. Although the strategies and concepts described have microprocessors manufactured in bulk CMOS technologies in mind, there is no fundamental reason why they cannot be applied to other technologies and different types of integrated circuits (ICs). Radiation-induced Soft Errors: A Chip-level Modeling Perspective starts by introducing the key strategy for modeling chip-level soft error rates (SER)...