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Kategorie szczegółowe BISAC
 Advanced BDD Optimization Rudiger Ebendt Gorschwin Fey Rolf Drechsler 9781441937964 Not Avail
Advanced BDD Optimization

Rudiger Ebendt Gorschwin Fey Rolf Drechsler

VLSI CAD has greatly benefited from the use of reduced ordered Binary Decision Diagrams (BDDs) and the clausal representation as a problem of "Boolean Satisfiability" (SAT), e.g. in logic synthesis, verification or design-for-testability. In recent practical applications, BDDs are optimized with respect to new objective functions for design space exploration. The latest trends show a growing number of proposals to fuse the concepts of BDD and SAT.

Advanced BDD Optimization gives a modern presentation of the established as well as of recent concepts. Latest results in BDD optimization...

VLSI CAD has greatly benefited from the use of reduced ordered Binary Decision Diagrams (BDDs) and the clausal representation as a problem of "Bool...

cena: 602,40
 Robustness and Usability in Modern Design Flows Gorschwin Fey Rolf Drechsler 9789048176625 Springer
Robustness and Usability in Modern Design Flows

Gorschwin Fey Rolf Drechsler
The size of technically producible integrated circuits increases continuously. But the ability to design and verify these circuits does not keep up with this development. Therefore, today s design ?ow has to be improved to achieve a higher productivity. In this book the current design methodology and ver- cation methodology are analyzed, a number of de?ciencies are identi?ed, and solutions are suggested. Improvements in the methodology as well as in the underlying algorithms are proposed. An in-depth presentation of preliminary concepts makes the book self-contained. Based on this foundation...
The size of technically producible integrated circuits increases continuously. But the ability to design and verify these circuits does not keep up wi...
cena: 401,58
 Test Digitaler Schaltkreise Eggersglüß, Stephan 9783486720136 Oldenbourg Wissenschaftsverlag
Test Digitaler Schaltkreise

Eggersglüß, Stephan

Eingebettete Systeme ubernehmen zentrale Steueraufgaben im taglichen Leben. In der Energieversorgung oder im Transportwesen wurde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlasst sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstuchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.

"

Eingebettete Systeme ubernehmen zentrale Steueraufgaben im taglichen Leben. In der Energieversorgung oder im Transportwesen wurde ein Ausfall der S...

cena: 381,33
 Debug Automation from Pre-Silicon to Post-Silicon Mehdi Dehbashi Gorschwin Fey 9783319093086 Springer
Debug Automation from Pre-Silicon to Post-Silicon

Mehdi Dehbashi Gorschwin Fey
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults) finds the...
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The ...
cena: 200,77
 Debug Automation from Pre-Silicon to Post-Silicon Mehdi Dehbashi Gorschwin Fey 9783319356105 Springer
Debug Automation from Pre-Silicon to Post-Silicon

Mehdi Dehbashi Gorschwin Fey
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults) finds the...
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The ...
cena: 200,77


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