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Kategorie szczegółowe BISAC
 Novel Algorithms for Fast Statistical Analysis of Scaled Circuits Amith Singhee Rob A. Rutenbar 9789048130993 Springer
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Amith Singhee Rob A. Rutenbar

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance,...

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations ...

cena: 402,53
 Extreme Statistics in Nanoscale Memory Design Amith Singhee Rob A. Rutenbar 9781441966056 Not Avail
Extreme Statistics in Nanoscale Memory Design

Amith Singhee Rob A. Rutenbar
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to...
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations a...
cena: 603,81
 Novel Algorithms for Fast Statistical Analysis of Scaled Circuits Singhee, Amith; Rutenbar, Rob A. 9789400736870 Springer Netherlands
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Singhee, Amith; Rutenbar, Rob A.

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance,...

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations ...

cena: 402,53
 Extreme Statistics in Nanoscale Memory Design Amith Singhee Rob A. Rutenbar 9781461426721 Springer
Extreme Statistics in Nanoscale Memory Design

Amith Singhee Rob A. Rutenbar
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to...
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations a...
cena: 603,81


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