Electronic applications are currently developed under the reuse-based paradigm. This design methodology presents several advantages for the reduction of the design complexity, but brings new challenges for the test of the final circuit. In this manuscript, the main problems of the test of core-based systems are firstly identified and the current solutions are discussed. Then, two power-aware test planning approaches are proposed aiming at reducing the test costs of a core-based system by means of hardware reuse and integration of the test planning into the design flow. The first approach...
Electronic applications are currently developed under the reuse-based paradigm. This design methodology presents several advantages for the reduction ...
