The characterisation of semiconductor devices has an important role in Microelectronics, especially in the case of power semiconductor devices, in which the electrothermal characterisation is an essential aspect to study their behaviour. In several Power Electronics applications, non-controlled electrothermal phenomena are the responsible for the device destruction. The internal self-heating experienced by Power Devices generates an internal temperature rise, which may negatively affect their internal physical behaviour. In this framework, this book covers the development of an experimental...