The 2005 meeting in Taormina, Italy was attended by 127 professionals who develop and use the highest quality detectors for wavelengths from x-ray to sub-mm, with emphasis on optical and infrared detectors. The meeting consisted of overview talks, technical presentations, poster sessions and roundtable discussions.

These proceedings capture the technical content and the spirit of the 2005 workshop. The 87 papers cover a wide range of detector technologies including CCDs, CMOS, APDs, and sub-mm detectors. There are papers on observatory status and plans, special applications, detector...