This volume contains a collection of papers presented at the NATO Advanced Study Institute on .Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability,...
This volume contains a collection of papers presented at the NATO Advanced Study Institute on .Testing and Diagnosis of VLSI and ULSI" held at Villa O...