The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting ma...
This volume contains invited and contributed papers presented at the conference on Microscopy of Semiconducting Materials held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries....
This volume contains invited and contributed papers presented at the conference on Microscopy of Semiconducting Materials held at the University of Ca...
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting ma...
