Interconnection Noise in VLSI Circuits addresses two main problems with interconnections at the chip and package level: crosstalk and simultaneous switching noise. It is intended to provide the notions required for understanding the problem of modeling starting from physical arguments, so that it is possible to select an appropriate interconnection model that is both simple and accurate for the type of problems arising. Later, simple models of crosstalk and switching noise are used to give an intuitive understanding of these problems. Finally, some verification and test...

Tunnel FET (TFET) devices have been explored mostly in digital circuits, showing promising results for ultra-low power and energy efficient circuit applications. In this book, the TFET is explored as an alternative technology for ultra-low power and voltage conversion and management circuits, suitable for weak energy harvesting (EH) sources.